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Residual stresses and ion implantation effects in Cr thin films

✍ Scribed by A Misra; S Fayeulle; H Kung; T.E Mitchell; M Nastasi

Book ID: 114170727
Publisher: Elsevier Science
Year: 1999
Tongue: English
Weight: 188 KB
Volume: 148
Category: Article
ISSN: 0168-583X
DOI: 10.1016/s0168-583x(98)00780-0

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