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Residual Stress: Measurement by Diffraction and Interpretation

โœ Scribed by Dr. Ismail C. Noyan, Prof. Jerome B. Cohen (auth.)


Publisher
Springer-Verlag New York
Year
1987
Tongue
English
Leaves
285
Series
Materials Research and Engineering
Edition
1
Category
Library

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โœฆ Table of Contents


Front Matter....Pages I-X
Introduction....Pages 1-12
Fundamental Concepts in Stress Analysis....Pages 13-46
Analysis of Residual Stress Fields Using Linear Elasticity Theory....Pages 47-74
Fundamental Concepts in X-ray Diffraction....Pages 75-116
Determination of Strain and Stress Fields by Diffraction Methods....Pages 117-163
Experimental Errors Associated with the X-ray Measurement of Residual Stress....Pages 164-210
The Practical Use of X-ray Techniques....Pages 211-229
The Shape of Diffraction Peaks โ€” X-ray Line Broadening....Pages 230-247
Back Matter....Pages 248-276

โœฆ Subjects


Characterization and Evaluation of Materials


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