Residual stress in spark-plasma-sintered and hot-pressed tantalum samples determined by X-ray diffraction methods

✍ Scribed by P. Angerer; W. Artner; E. Neubauer; L.G. Yu; K.A. Khor

• Book ID: 113656368
• Publisher: Elsevier Science
• Year: 2008
• Tongue: English
• Weight: 199 KB
• Volume: 26
• Category: Article
• ISSN: 0263-4368
• DOI: 10.1016/j.ijrmhm.2007.08.002