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Residual stress in Si nanocrystals embedded in a SiO[sub 2] matrix

✍ Scribed by Arguirov, T.; Mchedlidze, T.; Kittler, M.; Rölver, R.; Berghoff, B.; Först, M.; Spangenberg, B.


Book ID
120469790
Publisher
American Institute of Physics
Year
2006
Tongue
English
Weight
277 KB
Volume
89
Category
Article
ISSN
0003-6951

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