✦ LIBER ✦
Residual stress fields in surface-treated silicon carbide for space industry—comparison of biaxial and triaxial analysis using different X-ray methods
✍ Scribed by Ch. Genzel; M. Klaus; I. Denks; H.G. Wulz
- Publisher
- Elsevier Science
- Year
- 2005
- Tongue
- English
- Weight
- 229 KB
- Volume
- 390
- Category
- Article
- ISSN
- 0921-5093
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