Residual Resistance Ratio in $\hbox{Nb}_{3}\hbox{Sn}$ Strands During ITER TF Conductor Manufacture and After SULTAN Tests

✍ Scribed by Fetisov, Sergey S.; Polyakova, Nelly V.; Kaverin, Denis S.; Potanina, Liudmila V.; Shutov, Kirill A.; Svalov, Grigory G.; Tronza, Vladimir I.; Vysotsky, Vitaly S.

• Book ID: 127150553
• Publisher: IEEE
• Year: 2014
• Tongue: English
• Weight: 710 KB
• Volume: 24
• Category: Article
• ISSN: 1051-8223
• DOI: 10.1109/tasc.2013.2290283