𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Researcher Bias: The Use of Machine Learning in Software Defect Prediction

✍ Scribed by Shepperd, Martin (author);Bowes, David (author);Hall, Tracy (author)


Book ID
125500411
Publisher
Institute of Electrical and Electronics Engineers Inc.
Year
2014
Tongue
English
Weight
531 KB
Volume
40
Category
Article
ISSN
0098-5589

No coin nor oath required. For personal study only.


πŸ“œ SIMILAR VOLUMES