✦ LIBER ✦
Research of high-temperature instability processes in buried dielectric of full depleted SOI MOSFET's
✍ Scribed by A.N. Nazarov; J.-P. Colinge; I.P. Barchuk
- Book ID
- 104306453
- Publisher
- Elsevier Science
- Year
- 1997
- Tongue
- English
- Weight
- 309 KB
- Volume
- 36
- Category
- Article
- ISSN
- 0167-9317
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