Research of a test sequence to detect defects in sequential logic circuits: é and ié. Onde Elec.52, No. 3, March (1972), p. 140. (In French.)

• Publisher: Elsevier Science
• Year: 1972
• Tongue: English
• Weight: 227 KB
• Volume: 11
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(72)90046-7