๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Representations and test planning methods for complex technical systems

โœ Scribed by V. V. Glushchenko

Publisher
Springer US
Year
1992
Tongue
English
Weight
601 KB
Volume
28
Category
Article
ISSN
1573-8337

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Any time a structure experiences stress reversal, part of its life is used up. The two most common types of stress cycles that cause the most damage in electronic equipment are thermal/temperature cycling and vibration cycling. These two types of cycling can occur separately or they can be combined.