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Reppen, B and Aas, E J: ‘Combined probabilistic testability calculation and compact test generation for PLAs’ J. Electron. Test., Theory Appl. Vol 2 No 3 (August 1991) pp 215–227


Publisher
Elsevier Science
Year
1991
Tongue
English
Weight
114 KB
Volume
15
Category
Article
ISSN
0141-9331

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