Thin - film solar cell technologies based on Si with a thickness of less than a fewmicrometers combine the low - cost potential of thin - film technologies with the advantagesof Si as an abundantly available element in the earth's crust and a readily manufac -turable ma te rial for photovoltaics (PV
โฆ LIBER โฆ
Repolarization studies in amorphous and polycrystalline silicon
โ Scribed by A. Singh; E. A. Davis; F. L. Pratt; S. F. J. Cox
- Book ID
- 112685639
- Publisher
- Springer
- Year
- 1994
- Tongue
- English
- Weight
- 255 KB
- Volume
- 86
- Category
- Article
- ISSN
- 0304-3843
No coin nor oath required. For personal study only.
๐ SIMILAR VOLUMES
Amorphous Silicon, Microcrystalline Sili
โ
Schropp R.E., Carius R., Beaucarne G.
๐
Library
๐
2007
๐
English
โ 529 KB
Muon spin resonance and repolarization i
โ
E. A. Davis; A. Singh; S. F. J. Cox; S. R. Kreitzman; T. L. Estle; B. Hitti; R.
๐
Article
๐
1994
๐
Springer
๐
English
โ 268 KB
Outdoor performance of amorphous silicon
โ
Kholid Akhmad; Akio Kitamura; Fumio Yamamoto; Hiroaki Okamoto; Hideyuki Takakura
๐
Article
๐
1997
๐
Elsevier Science
๐
English
โ 551 KB
Dynamic modeling of amorphous- and polyc
โ
Colalongo, L.; Valdinoci, M.; Pellegrini, A.; Rudan, M.
๐
Article
๐
1998
๐
IEEE
๐
English
โ 405 KB
Study of Polycrystalline and Amorphous L
โ
Pleschinger, A.; Lutz, J.; Kuchar, F.; Noll, H.; Pippan, M.
๐
Article
๐
1997
๐
John Wiley and Sons
๐
English
โ 181 KB
๐ 2 views
The surface topography and structure of low-pressure chemical vapour-deposited silicon รlms grown on the thermal oxide of (100) silicon substrates have been investigated using atomic force microscopy. The measurements have been performed on undoped as-grown samples with deposition temperatures betwe
Concentration profiles of boron implanta
โ
Hofker, W. K.; Oosthoek, D. P.; Koeman, N. J.; M. de grefte, H. A.
๐
Article
๐
1975
๐
Informa UK (Taylor & Francis)
โ 698 KB