Reply to Comments on "A Causal Redefinition of Failure RateߞTheorems, Stress Dependence, and Application to Devices and Distributions"

✍ Scribed by Stewart, Robert G.

• Book ID: 117932831
• Publisher: IEEE
• Year: 1967
• Tongue: English
• Weight: 481 KB
• Volume: R-16
• Category: Article
• ISSN: 0018-9529
• DOI: 10.1109/tr.1967.5217483