Reply to “Comment on ‘Numerical Models for Predicting Tracer Profiles in Silicon Double-Oxidation Experiments’”

✍ Scribed by James D. Cawley

• Book ID: 110826999
• Publisher: John Wiley and Sons
• Year: 1995
• Tongue: English
• Weight: 68 KB
• Volume: 78
• Category: Article
• ISSN: 0002-7820
• DOI: 10.1111/j.1151-2916.1995.tb08709.x