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Removing interference and optical feedback artifacts in atomic force microscopy measurements by application of high frequency laser current modulation

✍ Scribed by Kassies, Roel; van der Werf, Kees O.; Bennink, Martin L.; Otto, Cees


Book ID
121713337
Publisher
American Institute of Physics
Year
2004
Tongue
English
Weight
545 KB
Volume
75
Category
Article
ISSN
0034-6748

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