✦ LIBER ✦
Remote charge scattering: a full Coulomb interaction approach and its impact on silicon nMOS FinFETs with HfO2gate dielectric
✍ Scribed by KangLiang Wei, James Egley, XiaoYan Liu, Gang Du
- Book ID
- 120799688
- Publisher
- Science in China Press (SCP)
- Year
- 2013
- Tongue
- English
- Weight
- 626 KB
- Volume
- 57
- Category
- Article
- ISSN
- 1674-733X
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