Remarks on statistical errors in equivalent widths

✍ Scribed by K. Vollmann; T. Eversberg

• Book ID: 101695856
• Publisher: John Wiley and Sons
• Year: 2006
• Tongue: English
• Weight: 100 KB
• Volume: 327
• Category: Article
• ISSN: 0004-6337
• DOI: 10.1002/asna.200610645

✦ Synopsis

Equivalent width measurements for rapid line variability in atomic spectral lines are degraded by increasing error bars with shorter exposure times. We derive an expression for the error of the line equivalent width σ(W λ ) with respect to pure photon noise statistics and provide a correction value for previous calculations.