✦ LIBER ✦
Reliable Assessment of Progressive Breakdown in Ultrathin MOS Gate Oxides Toward Accurate TDDB Evaluation
✍ Scribed by Tsujikawa, S.; Kanno, M.; Nagashima, N.
- Book ID
- 118698618
- Publisher
- IEEE
- Year
- 2011
- Tongue
- English
- Weight
- 633 KB
- Volume
- 58
- Category
- Article
- ISSN
- 0018-9383
No coin nor oath required. For personal study only.