✦ LIBER ✦
Reliability Tradeoffs and Scaling Issues of Read Drain Bias in nor Flash Memory
✍ Scribed by Yung-Huei Lee; McMahon, W.; Lu, Y.-L.R.; Freidin, Z.
- Book ID
- 114619730
- Publisher
- IEEE
- Year
- 2009
- Tongue
- English
- Weight
- 645 KB
- Volume
- 56
- Category
- Article
- ISSN
- 0018-9383
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