✦ LIBER ✦
Reliability study on polycrystalline silicon thin film resistors used in LSIs under thermal and electrical stress : Hiroko Akimori, Nobuo Owada, Tadayuki Taneoka and Hizura UDA. 28th A. Proc. Reliab. Phys. Symp. (IEEE), 276 (March 1990)
- Publisher
- Elsevier Science
- Year
- 1991
- Tongue
- English
- Weight
- 118 KB
- Volume
- 31
- Category
- Article
- ISSN
- 0026-2714
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