Reliability study of microwave GaAs field-effect transistors : Ronald E. Lundgren and Glenn O. Ladd.Proc. IEEE Reliab. Phys. Symp., San Diego (18–20 April 1978), p. 255

• Publisher: Elsevier Science
• Year: 1978
• Tongue: English
• Weight: 123 KB
• Volume: 18
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(78)90038-0