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Reliability study of InAs∕InGaAs quantum dot diode lasers

✍ Scribed by Krestnikov, I.; Livshits, D.; Mikhrin, S.; Kozhukhov, A.; Kovsh, A.; Ledentsov, N.; Zhukov, A.

Book ID: 120421507
Publisher: The Institution of Electrical Engineers
Year: 2005
Tongue: English
Weight: 77 KB
Volume: 41
Category: Article
ISSN: 0013-5194
DOI: 10.1049/el:20053336

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