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Reliability study of bulk and SOI SRAMs using high energy nuclear probes

✍ Scribed by Satoshi Abo; Hiroto Yamagiwa; Toshiaki Iwamatsu; Shigeto Maegawa; Yutaka Arita; Takashi Ipposhi; Atsushi Kinomura; Fujio Wakaya; Mikio Takai

Publisher: Elsevier Science
Year: 2005
Tongue: English
Weight: 178 KB
Volume: 231
Category: Article
ISSN: 0168-583X
DOI: 10.1016/j.nimb.2005.01.104

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