✦ LIBER ✦
Reliability study of a microwave Ga As field-effect transistor, by means of factorial analysis and automatic classification methods : Alain Lelievre. Microelectron. Reliab.23 (4), 745 (1983)
- Book ID
- 103276199
- Publisher
- Elsevier Science
- Year
- 1984
- Tongue
- English
- Weight
- 101 KB
- Volume
- 24
- Category
- Article
- ISSN
- 0026-2714
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