✦ LIBER ✦
Reliability studies on GaN HEMTs with sputtered Iridium gate module
✍ Scribed by Richard Lossy; Hervé Blanck; Joachim Würfl
- Book ID
- 119326743
- Publisher
- Elsevier Science
- Year
- 2012
- Tongue
- English
- Weight
- 604 KB
- Volume
- 52
- Category
- Article
- ISSN
- 0026-2714
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