✦ LIBER ✦
Reliability prediction using nondestructive accelerated-degradation data: case study on power supplies
✍ Scribed by Loon Ching Tang; Dong Shang Chang
- Book ID
- 114555463
- Publisher
- IEEE
- Year
- 1995
- Tongue
- English
- Weight
- 450 KB
- Volume
- 44
- Category
- Article
- ISSN
- 0018-9529
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