Reliability prediction of solid dielectrics using electrical Noise as a screening parameter

✍ Scribed by Misra, R.; Pandey, S.; Sundaresan, V.

• Book ID: 114555736
• Publisher: IEEE
• Year: 1991
• Tongue: English
• Weight: 531 KB
• Volume: 40
• Category: Article
• ISSN: 0018-9529
• DOI: 10.1109/24.75346