Reliability prediction of MOS devices: experiments and model for charge build up and annealing : F. Wulf, D. Braunig and W. Nickel. Proc. IEEE/IRPS, 150 (1988)

• Book ID: 103285078
• Publisher: Elsevier Science
• Year: 1989
• Tongue: English
• Weight: 134 KB
• Volume: 29
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(89)90194-7