✦ LIBER ✦
Reliability of trench capacitors for VLSI memories : D. A. Baglee, C. Beydler, P. Shih and M. Yashiro. 24 a. Proc. IEEE Reliab. Phys. Symp., 215 (1986)
- Publisher
- Elsevier Science
- Year
- 1987
- Tongue
- English
- Weight
- 124 KB
- Volume
- 27
- Category
- Article
- ISSN
- 0026-2714
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