Reliability of three-state device systems with simultaneous failures : Nato Satoh et al. IEEE Transactions on Reliability, 42(3), 470 (September 1993)

• Book ID: 103283144
• Publisher: Elsevier Science
• Year: 1994
• Tongue: English
• Weight: 105 KB
• Volume: 34
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(94)90369-7