✦ LIBER ✦
Reliability of the structure Au/Cr/Au-Ge/Ni/GaAs in lownoise dual gate GaAs FET
✍ Scribed by J.-F. Bresse
- Publisher
- Elsevier Science
- Year
- 1985
- Tongue
- English
- Weight
- 934 KB
- Volume
- 25
- Category
- Article
- ISSN
- 0026-2714
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