Reliability of tantalum thin film capacitor with MnO2 layer : T. Kamo, J. Yamazaki and M. Nakamura. Abstracts—Trans. Inst. Electron. Commun. Eng. Japan. 57, 4, 23 (April 1974)

• Publisher: Elsevier Science
• Year: 1975
• Tongue: English
• Weight: 123 KB
• Volume: 14
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(75)90332-7