✦ LIBER ✦
Reliability of reverse properties of power semiconductor devices:: Influence of surface dielectric layer and its experimental verification
✍ Scribed by V. Papež; B. Kojecký; D. Šámal
- Publisher
- Elsevier Science
- Year
- 2008
- Tongue
- English
- Weight
- 255 KB
- Volume
- 39
- Category
- Article
- ISSN
- 0026-2692
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