Reliability of Repetitively Avalanched Wire-Bonded Low-Voltage Discrete Power Trench n-MOSFETs

✍ Scribed by Alatise, O.; Kennedy, I.; Petkos, G.; Koh, A.

• Book ID: 118117806
• Publisher: IEEE
• Year: 2011
• Tongue: English
• Weight: 848 KB
• Volume: 11
• Category: Article
• ISSN: 1530-4388
• DOI: 10.1109/tdmr.2010.2102026