Reliability of printed wiring boards by thermal shock test : Tanaka Hjirokazu, Yuuichi Aoki and Yamamoto Shigeharu. Proceedings of the 24th Symposium on Reliability and Maintainability, Japan, 79 (6–8 July 1994).

• Book ID: 108362322
• Publisher: Elsevier Science
• Year: 1997
• Tongue: English
• Weight: 114 KB
• Volume: 37
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/s0026-2714(97)87775-x