Reliability of next-generation networks with a focus on IMS architecture

✍ Scribed by Himanshu Pant; Chi-Hung Kelvin Chu; Steven H. Richman; Ahmad Jrad; Gerard P. O'Reilly

• Publisher: Institute of Electrical and Electronics Engineers
• Year: 2008
• Tongue: English
• Weight: 252 KB
• Volume: 12
• Category: Article
• ISSN: 1089-7089
• DOI: 10.1002/bltj.20270