Reliability of multi-channel Ga1−xAlxas high electron mobility transistor (HEMT) integrated circuits

✍ Scribed by A. Christou; Wen Tseng

• Book ID: 112184687
• Publisher: John Wiley and Sons
• Year: 1991
• Tongue: English
• Weight: 598 KB
• Volume: 7
• Category: Article
• ISSN: 0748-8017
• DOI: 10.1002/qre.4680070604