𝔖 Bobbio Scriptorium

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Reliability of MgAl Semiconductor Interconnects : J. M. Pankratz and D. R. Collins. IEEE Trans. Reliab.R-19, No. 3, August (1970), p. 89

Publisher: Elsevier Science
Year: 1971
Tongue: English
Weight: 108 KB
Volume: 10
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(71)90040-0

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