✦ LIBER ✦
Reliability of Ku-BAND GaAs power FETs under highly stressed RF operation : P. M. White, C. G. Rogers and B. S. Hewitt. IEEE 21st Ann. Proc. Reliab. Phys. 297 (1983)
- Publisher
- Elsevier Science
- Year
- 1984
- Tongue
- English
- Weight
- 129 KB
- Volume
- 24
- Category
- Article
- ISSN
- 0026-2714
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