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Reliability of hybrid microcircuits in use today : R. J. Straub, Proc. 1970 20th Electronic Components Conf., Washington, 13–15 May (1970), p. 16

Publisher: Elsevier Science
Year: 1971
Tongue: English
Weight: 112 KB
Volume: 10
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(71)90420-3

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