✦ LIBER ✦
Reliability of gate metallization in power GaAs MESFETS : K. Katsukawa, Y. Kose, M. Kanomori and S. Sando. Proc. IEEE Reliab. Phys. Conf. 59 (1984)
- Publisher
- Elsevier Science
- Year
- 1985
- Tongue
- English
- Weight
- 136 KB
- Volume
- 25
- Category
- Article
- ISSN
- 0026-2714
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