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Reliability of gate dielectrics of MOSFETs exposed to synchrotron radiation

✍ Scribed by G.S. Kousik; R.P. Nandakumar; P.K. Bhattacharya

Publisher: Elsevier Science
Year: 1992
Tongue: English
Weight: 410 KB
Volume: 319
Category: Article
ISSN: 0168-9002
DOI: 10.1016/0168-9002(92)90576-p

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