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Reliability of GaAs1−xPx light emitting diodes: Shin-Ichiro Koyama, Toshihiko Kohisa and Shigeru Suzuki. Proceedings 1973 IEEE Annual Reliability Maintainability Symposium. 23–25 January (1973), p. 203


Publisher
Elsevier Science
Year
1973
Tongue
English
Weight
106 KB
Volume
12
Category
Article
ISSN
0026-2714

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