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Reliability of all possible series-parallel redundant structures of M.I.I.D. units with two failure modes: Yuji Nakagawa and Yoshio Hattori. IEEE Trans. Reliab. R-29 (4), 320 (October 1980)


Book ID
103274871
Publisher
Elsevier Science
Year
1981
Tongue
English
Weight
115 KB
Volume
21
Category
Article
ISSN
0026-2714

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