Reliability modelling of TMR computer systems with repair and common mode failures: C. Singh. Microelectron. Reliab. 21 (2) 259 (1981)

• Publisher: Elsevier Science
• Year: 1982
• Tongue: English
• Weight: 117 KB
• Volume: 22
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(82)90117-2