Reliability model and analysis of a system with nonexponential down-time distributions including a derated state : K. F. Schenk. Microelectron. Reliab. 16, 35 (1977)

• Publisher: Elsevier Science
• Year: 1977
• Tongue: English
• Weight: 124 KB
• Volume: 16
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(77)90518-2