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Reliability measurements for third-generation computer systems : E. Yourdon. Proceedings 1972 Annual Reliability and Maintainability Symposium, San Francisco. IEEE Cat. No. 72CH0577-7R. 25–27 January (1972), p. 174

Publisher: Elsevier Science
Year: 1972
Tongue: English
Weight: 117 KB
Volume: 11
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(72)90387-3

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