Reliability Limits of TMR Implemented in a SRAM-based FPGA: Heavy Ion Measures vs. Fault Injection Predictions

✍ Scribed by Gilles Foucard; Paul Peronnard; Raoul Velazco

• Book ID: 106384558
• Publisher: Springer US
• Year: 2011
• Tongue: English
• Weight: 280 KB
• Volume: 27
• Category: Article
• ISSN: 0923-8174
• DOI: 10.1007/s10836-011-5245-4