Reliability investigations of 850nm silicon photodiodes under proton irradiation for space applications

✍ Scribed by Bourqui, M.L.; Béchou, L.; Gilard, O.; Deshayes, Y.; Vecchio, P. Del; How, L.S.; Rosala, F.; Ousten, Y.; Touboul, A.

• Book ID: 108210773
• Publisher: Elsevier Science
• Year: 2008
• Tongue: English
• Weight: 258 KB
• Volume: 48
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/j.microrel.2008.07.012