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Reliability Improvement of superluminescent diodes emitting at 1.0 µm band using InGaAsP barrier structure

✍ Scribed by Hamamoto, K.; Ohgoh, T.; Asano, H.


Book ID
125519755
Publisher
The Institution of Electrical Engineers
Year
2013
Tongue
English
Weight
368 KB
Volume
49
Category
Article
ISSN
0013-5194

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